Time to failure measurements of MOS capacitor sets
Ayayi Ahyi
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Posted Jun 13, 2024
On wafer devices were continuously tested for several weeks until breakdown. To be significant a large number of devices were tested.
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Ayayi Ahyi
Posted Jun 13, 2024
On wafer devices were continuously tested for several weeks until breakdown. To be significant a large number of devices were tested.
0
9
